发明名称 Compressive conductors for semiconductor testing
摘要 An interconnect assembly electrically connecting two circuit members, which include respective arrays of electrical contacts for engagement with the interconnect assembly. The interconnect assembly comprises a plurality of electrical conductors, the plurality of conductors arranged in a spaced arrangement, the spaced arrangement of the conductors substantially corresponding to a spaced arrangement for the respective arrays of electrical contacts to provide contact between the conductors and the contact arrays and a carrier, including a socket and a retainer. The socket includes a plurality of apertures each receiving an upper portion of one of the plurality of conductors and the retainer includes a plurality of apertures each receiving a lower portion of one of the plurality of conductors; and the respective apertures are aligned axially with each other.
申请公布号 US7728611(B1) 申请公布日期 2010.06.01
申请号 US20070671942 申请日期 2007.02.06
申请人 INTERCONNECT DEVICES, INC. 发明人 KRAYNAK TIMOTHY L.
分类号 G01R31/02;H01R13/24 主分类号 G01R31/02
代理机构 代理人
主权项
地址