发明名称 Compactor independent direct diagnosis of test hardware
摘要 Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In one exemplary embodiment, a failure log is received including entries indicative of compressed test responses to chain patterns and compressed test responses to scan patterns. A faulty scan chain in the circuit-under-test is identified based at least in part on one or more of the entries indicative of the compressed test responses to chain patterns. One or more faulty scan cell candidates in the faulty scan chain are identified based at least in part on one or more of the entries indicative of the compressed test responses to scan patterns. The one or more identified scan cell candidates can be reported. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media storing lists of fault candidates identified by any of the disclosed methods are also provided.
申请公布号 US7729884(B2) 申请公布日期 2010.06.01
申请号 US20050267221 申请日期 2005.11.04
申请人 发明人 HUANG YU;CHENG WU-TUNG;RAJSKI JANUSZ
分类号 G06F11/30;G06F11/00 主分类号 G06F11/30
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