发明名称 INTEGRATED CONTROL SYSTEM FOR LASER AND MACH-ZEHNDER INTERFEROMETER
摘要 An integrated control system for a laser and Mach-Zehnder interferometer are disclosed and may include configuring a bias point for low-speed control of an optical modulator utilizing control circuitry integrated on the same CMOS die. The optical modulator may be differentially monitored. A laser source for the modulator may be controlled utilizing monitor photodiodes via optical taps on outputs of the modulator, or utilizing a monitor photodiode on one output port of the modulator, which may comprise a Mach-Zehnder interferometer. An error signal may be generated by subtracting monitor photodiode signals from optical taps on output ports of the modulator. The bias point of the modulator may be adjusted by minimizing the error signal. Calibration time of the bias point may be reduced utilizing electronic data inversion. An output of the modulator may comprise a Y-junction and a single monitor photodiode may measure both branches of the modulator.
申请公布号 US2010128336(A1) 申请公布日期 2010.05.27
申请号 US20090611584 申请日期 2009.11.03
申请人 WITZENS JEREMY;ANALUI BEHNAM;MIRSAIDI SINA;SADAGOPAN THIRUVIKRAMAN;WELCH BRIAN;NARASIMHA ADITHYARAM 发明人 WITZENS JEREMY;ANALUI BEHNAM;MIRSAIDI SINA;SADAGOPAN THIRUVIKRAMAN;WELCH BRIAN;NARASIMHA ADITHYARAM
分类号 G02F1/015 主分类号 G02F1/015
代理机构 代理人
主权项
地址
您可能感兴趣的专利