| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical characteristic measuring device and an optical characteristic measuring method capable of measuring a spectrum in a shorter period of time with high accuracy. SOLUTION: A processing device calculates a correction value based on a signal intensity detected in a correction area (step S204). Subsequently, the processing device calculates a correction measurement spectrum by subtracting the correction value calculated in the step S204, from each component value included in the measurement spectrum detected in a detection area acquired in step S202 (step S206). Hereat, the detection area is the area corresponding to an incident surface of light from a spectrometer, and the correction area is the area where light split by the spectrometer is not incident. COPYRIGHT: (C)2010,JPO&INPIT
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