发明名称 |
DEVICE ABNORMALITY DIAGNOSIS METHOD AND SYSTEM |
摘要 |
<p>Disclosed is a technique pertaining to a device abnormality diagnosis system which is able to easily create an abnormality diagnosis model with respect to an initial and a new example of a malfunction, and to add/update said model, and is able to use said model to properly and efficiently implement an abnormality analysis, a countermeasure instruction, and the like. With this abnormality diagnosis system, on the basis of obtained maintenance work data an abnormality diagnosis model creation processing unit creates, a causal relationship model which expresses a causal relationship between the types of the maintenance work and the alarms and operational events related thereto by means of a graphical network structure (S104). Then, that model is combined with an existing causal relationship model to update the abnormality diagnosis model (S106).</p> |
申请公布号 |
WO2010058765(A1) |
申请公布日期 |
2010.05.27 |
申请号 |
WO2009JP69482 |
申请日期 |
2009.11.17 |
申请人 |
HITACHI, LTD.;MIWA, TOSHIHARU;TAMAKI, KENJI |
发明人 |
MIWA, TOSHIHARU;TAMAKI, KENJI |
分类号 |
G06F11/30;G05B23/02;G06F11/22;G06F11/34;G06Q50/00;G06Q50/10 |
主分类号 |
G06F11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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