发明名称 METHOD OF FORMING SEMICONDUCTOR FILM, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming semiconductor films on dielectrics at temperatures below 400 DEG C. SOLUTION: This invention successfully achieves low temperature growth of germanium films using diboran. First, diboran gas is supplied into a reaction chamber at a temperature below 400 DEG C. The diboran decomposes itself at the given temperature and decomposed boron is attached to the surface of a dielectric, for e.g., SiO2, forming a nucleation site and/or a seed layer. Second, source gases for semiconductor film formation, for e.g., SiH4, GeH4, etc., are supplied into the reaction chamber, thereby forming a semiconductor film. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010118643(A) 申请公布日期 2010.05.27
申请号 JP20090162822 申请日期 2009.07.09
申请人 NEC CORP;UNIV LELAND STANFORD JR 发明人 TADA MUNEHIRO;SARASWAT KRISHNA
分类号 H01L21/205;C23C16/06;C23C16/28;H01L21/336;H01L29/786 主分类号 H01L21/205
代理机构 代理人
主权项
地址