发明名称 X-RAY DIFFRACTION APPARATUS AND X-RAY ADJUSTING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray diffraction apparatus with a smaller amount of movement required for X-ray adjustment and with a smaller amount of time required for X-ray adjustment. <P>SOLUTION: The X-ray diffraction apparatus including a horizontal goniometer to carry outθ-θscanning is configured to include a rolling mechanism 5 that rotates an X-ray source 2 on an axis of rotation orthogonal to a direction in which the X-ray source 2 emits X rays, wherein X-ray adjustment is carried out through the rotation of the X-ray source 2 by the rolling mechanism 5. The rolling mechanism 5 changes the direction of X-ray radiation by rotating the X-ray source 2. By changing the direction of X-ray radiation through rotational movements, the amount of movement required for X-ray adjustment and the amount of adjusting time required for X-ray adjustment are reduced. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010117368(A) 申请公布日期 2010.05.27
申请号 JP20100033218 申请日期 2010.02.18
申请人 SHIMADZU CORP 发明人 KOBAYASHI KANJI
分类号 G01N23/207 主分类号 G01N23/207
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