发明名称 SUBSTRATE PROCESSING APPARATUS AND CLEANING METHOD OF SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of cleaning a substrate processing apparatus including ion beam generators arranged opposite to each other, and a substrate processing apparatus having this function. SOLUTION: The method for cleaning the substrate processing apparatus in which a first and a second ion beam generators 1a, 1b are arranged opposite to each other across a plane S on which a substrate is to be placed, and which processes two surfaces of the substrate, includes steps of retreating the substrate from a position between the first ion beam generator 1a and the second ion beam generator 1b, and cleaning the second ion beam generator by emitting an ion beam from the first ion beam generator to the second ion beam generator. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010118648(A) 申请公布日期 2010.05.27
申请号 JP20090230993 申请日期 2009.10.02
申请人 CANON ANELVA CORP 发明人 ABARA EINSTEIN NOEL;SHIBAMOTO MASAHIRO
分类号 H01L21/304;G11B5/84;H01J37/305;H01J37/317 主分类号 H01L21/304
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