发明名称 DISPLAY DEFECT INSPECTION DEVICE, DISPLAY DEFECT INSPECTION METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a display defect inspection device for accurately inspecting defect on the outermost side of a lighting region of a display, and to provide a display defect inspection method, and a display defect inspection program. Ž<P>SOLUTION: The display defect inspection device includes: a control part 20 for lighting a peripheral edge region being a region of two pixel width parts from a boundary to the inside out of a lighting region of the display 2; an image acquisition part 100 for obtaining an imaging image imaging a prescribed range including the display 2; a region detection part 101 for detecting the peripheral edge region lighted with the control part 20 from imaging images obtained from the image acquisition part 100; and a defect extraction part 104 for extracting a smaller pixel part than prescribed brightness in the peripheral edge region as a dark defect on the basis of the measurement result by measuring brightness of the peripheral edge region on the basis of the detection result of the region detection part 101. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010117295(A) 申请公布日期 2010.05.27
申请号 JP20080291902 申请日期 2008.11.14
申请人 FUJITSU LTD 发明人 KARASUYA AYU
分类号 G01M11/00;G09F9/00 主分类号 G01M11/00
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