发明名称 GAN-BASED FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 A GaN-based field effect transistor 101 comprises: a substrate 101; a channel layer 104 comprised of p-type GaN-based semiconductor material formed on the substrate 101; an electron supplying layer 106 formed on said channel layer 104 and comprised of GaN-based semiconductor material which has band gap energy greater than that of said channel layer 104; a gate insulating film 111 formed on a surface of said channel layer which was exposed after a part of said electron supplying layer was removed; a gate electrode 112 formed on said gate insulating film; a source electrode 109 and a drain electrode 110 formed so that said gate electrode 112 positions in between them; and a second insulating film 113 formed on said electron supplying layer, which is a different insulating film from said gate insulating film 111 and has electron collapse decreasing effect.
申请公布号 US2010127275(A1) 申请公布日期 2010.05.27
申请号 US20090625579 申请日期 2009.11.25
申请人 FURUKAWA ELECTRIC CO., LTD. 发明人 TAKEHIKO NOMURA;YOSHIHIRO SATO;HIROSHI KAMBAYASHI;SHUSUKE KAYA;MASAYUKI IWAMI;SADAHIRO KATO
分类号 H01L29/786;H01L21/336;H01L29/205 主分类号 H01L29/786
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