| 摘要 |
<p>Test equipment comprises a phase control unit for sequentially changing the relative phases of the input/output data of a device under test and a predetermined strobe signal toward a predetermined single direction; an expected value comparing unit for determining a predetermined number of times at each relative phase whether a value obtained by sampling the input/output data using the strobe signal matches a predetermined expected value or not; a phase detection unit for detecting a first relative phase in which a failure state transits to a pass state and a second relative phase in which the pass state transits to the failure state, wherein the failure state indicates that at least one of the determination results of the predetermined number of times shows mismatch and the pass state indicates that all the determination results of the predetermined number of times show match; a phase adjusting unit for adjusting, based on the first and second relative phases detected by the phase detection unit, the phase of a test signal supplied to the device under test; and a test unit for testing the device under test using the test signal, the phase of which has been adjusted by the phase adjusting unit. This reduces time required for timing training.</p> |
