发明名称 APPARATUS FOR AND METHOD OF PROCESSING SUBSTRATE SUBJECTED TO EXPOSURE PROCESS
摘要 A method of processing a substrate subjected to an exposure process includes the steps of: transporting a substrate subjected to the exposure process to a cleaning processing part and performing a cleaning process in said cleaning processing part on said substrate subjected to the exposure process. The method also includes the steps of transporting said substrate subjected to the cleaning process from said cleaning processing part to a heating processing part and performing a heating process in said heating processing part on said substrate subjected to the cleaning process. A first interprocess time interval between the instant at which the exposure process of a substrate is completed and the instant at which the heating process of the substrate is started is made approximately constant, and a second interprocess time interval between the instant at which the cleaning process of the substrate is completed and the instant at which the heating process of the substrate is started is made approximately constant.
申请公布号 US2010126527(A1) 申请公布日期 2010.05.27
申请号 US20100698888 申请日期 2010.02.02
申请人 SOKUDO CO., LTD. 发明人 HAMADA TETSUYA
分类号 B08B7/00;G03F7/38;H01L21/027;H01L21/304;H01L21/677 主分类号 B08B7/00
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