发明名称 MANUFACTURING METHOD OF GATE PATTERN FOR FLASH MEMORY DEVICE
摘要 <p>PURPOSE: A method of manufacturing a gate pattern for flash memory device is provided to improve a signal channel effect by forming the bottom of the floating gate in the gate trench. CONSTITUTION: In a method of manufacturing a gate pattern for flash memory device, a gate trench mask is formed on a semiconductor substrate(101). A spacer(105) is formed on the both side walls of the gate trench mask. The gate trench is formed on the semiconductor substrate by etching the semiconductor substrate. A floating gate(111a) is formed between a gate trench mask between neighboring spacers. A dielectric film is formed at an upper part of the floating gate. A control gate is formed on the dielectric film.</p>
申请公布号 KR20100054469(A) 申请公布日期 2010.05.25
申请号 KR20080113415 申请日期 2008.11.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HYO YOUNG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址