发明名称 High performance power MOS structure
摘要 A semiconductor device includes a source region and a drain region disposed in a substrate wherein the source and drain regions have a first type of dopant; a gate electrode formed on the substrate interposed laterally between the source and drain regions; a gate spacer disposed on the substrate and laterally between the source region and the gate electrode, adjacent a side of the gate electrode; and a conductive feature embedded in the gate spacer.
申请公布号 US7723785(B2) 申请公布日期 2010.05.25
申请号 US20070831689 申请日期 2007.07.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN YU WEN;CHEN FU-HSIN;HUANG TSUNG-YI;TSAI YT
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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