发明名称 |
NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF |
摘要 |
PURPOSE: A non-volatile memory device and a reading method thereof are provided to compensate an increased threshold voltage by changing a read voltage and a reading reference voltage. CONSTITUTION: A memory cell array is connected to a plurality of word lines. A voltage generator applies a selection read voltage to a selection word line(WL28) among the word lines during a reading operation state. The voltage generator applies a non-selection read voltage to a non-selection word line during the reading operation state. The voltage generator changes the level of the non-selection read voltage according to an adjacency state with the selection word line. The voltage generator supplies a non-selection read voltage which is lower than at least one non-selection read voltage among an upper word line(WL29) and a lower word line(WL27) when the threshold voltage of the selection memory cell is reduced.
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申请公布号 |
KR20100054566(A) |
申请公布日期 |
2010.05.25 |
申请号 |
KR20080113531 |
申请日期 |
2008.11.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHANG HYUN;CHOI, JUNG DAL;CHOE, BYEONG IN |
分类号 |
G11C16/34;G11C16/08;G11C16/12;G11C16/26 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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