发明名称 NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF
摘要 PURPOSE: A non-volatile memory device and a reading method thereof are provided to compensate an increased threshold voltage by changing a read voltage and a reading reference voltage. CONSTITUTION: A memory cell array is connected to a plurality of word lines. A voltage generator applies a selection read voltage to a selection word line(WL28) among the word lines during a reading operation state. The voltage generator applies a non-selection read voltage to a non-selection word line during the reading operation state. The voltage generator changes the level of the non-selection read voltage according to an adjacency state with the selection word line. The voltage generator supplies a non-selection read voltage which is lower than at least one non-selection read voltage among an upper word line(WL29) and a lower word line(WL27) when the threshold voltage of the selection memory cell is reduced.
申请公布号 KR20100054566(A) 申请公布日期 2010.05.25
申请号 KR20080113531 申请日期 2008.11.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHANG HYUN;CHOI, JUNG DAL;CHOE, BYEONG IN
分类号 G11C16/34;G11C16/08;G11C16/12;G11C16/26 主分类号 G11C16/34
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