发明名称 Defect analysis place specifying device and defect analysis place specifying method
摘要 A defect analysis place specifying device for specifying defect analysis places from an inspection result of produced printed wiring boards in an electronic part mounting device for mounting parts on the printed wiring boards through plural steps, including an accepting unit for accepting plural printed wiring boards as inspection targets every predetermined unit, a defect mode specifying unit for specifying a defect mode having a predetermined frequency or more on the basis of the defect modes of the printed wiring boards and the occurrence frequencies thereof in the last step of the plural steps every unit accepted by the accepting unit, an extracting unit for extracting a combination having the same abnormal phenomenon causing the defect mode specified by the defect mode specifying unit in the other steps than the last step in the plural steps, and an output unit for outputting the combination extracted by the extracting unit.
申请公布号 US7724941(B2) 申请公布日期 2010.05.25
申请号 US20060580227 申请日期 2006.10.13
申请人 OMRON CORPORATION 发明人 MORI HIROYUKI;SUGIHARA HISASHI
分类号 G06K9/00;G01R31/00 主分类号 G06K9/00
代理机构 代理人
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