发明名称 |
RECONFIGURABLE SERIAL SIGNAL GENERATOR IN MEMORY MODULE TESTER |
摘要 |
PURPOSE: A memory module test apparatus of a serial signal generator is provided to test a memory module which have various SPD(Serial Presence Detect) performance characteristic by resetting a test signal property in response to the operation characteristic of a SPD device. CONSTITUTION: A serial clock generating part(145) generates a serial clock signal of a SPD device and a reset signal in response to an internal clock signal. A timing reset part(146) gets a plurality of delay clock signals which have different delay property by delaying the internal clock signal after being enabled in response to the reset signal. A timing reset part selects one among a plurality of delay clock signals obtaining in response to the timing reset value. The timing reset part outputs a selected signal to the resetting clock signal. A serial data generating part generates serial data of a SPD device in which the timing is reset from the edge of the serial clock signal after receiving a resetting clock signal. |
申请公布号 |
KR20100053790(A) |
申请公布日期 |
2010.05.24 |
申请号 |
KR20080112586 |
申请日期 |
2008.11.13 |
申请人 |
EXICON CO., LTD. |
发明人 |
PARK, SANG HYUK;SHIN, SEONG WOOK |
分类号 |
G11C29/00;G11C7/22;G11C8/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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