发明名称 REPLACING DEFECTIVE MEMORY BLOCKS IN RESPONSE TO EXTERNAL ADDRESSES
摘要 Electronic systems and methods of operating memory devices are provided. In one such embodiment, a memory device receives an external address that addresses a non-defective memory block of a sequence of memory blocks of the memory device in place of a defective memory block of the sequence of memory blocks such that the non-defective memory block replaces the defective memory block. The non-defective memory block is proximate non-defective memory block following the defective memory block in the sequence of memory blocks that is available to replace the defective memory block.
申请公布号 US2010124133(A1) 申请公布日期 2010.05.20
申请号 US20080274426 申请日期 2008.11.20
申请人 SARIN VISHAL;NGUYEN DZUNG H;RADKE WILLIAM H 发明人 SARIN VISHAL;NGUYEN DZUNG H.;RADKE WILLIAM H.
分类号 G11C29/00;G11C8/00 主分类号 G11C29/00
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