发明名称 |
SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an apparatus improving uniformity of processing quality over the entire principal surface of a substrate by reducing unevenness in processing speed in the substrate surface even if a film formed on the substrate is uneven in thickness or differs in film quality with parts on the substrate. Ž<P>SOLUTION: The apparatus which performs dip processing includes a storage tank 10 for reserving a processing liquid, a means of conveying the substrate W in the processing liquid reserved in the storage tank, piping 12 for temperature control disposed in an area where the temperature of the processing liquid needs to be partially controlled, and a means of supplying into the piping for temperature control a medium for temperature control having a temperature different from that of the processing liquid supplied to and reserved in the storage tank. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010114107(A) |
申请公布日期 |
2010.05.20 |
申请号 |
JP20080282703 |
申请日期 |
2008.11.04 |
申请人 |
DAINIPPON SCREEN MFG CO LTD |
发明人 |
TOMIFUJI YUKIO;YOSHIKAWA NORIO |
分类号 |
H01L21/306;B65G49/02;B65G49/06;B65G49/07;H01L21/677 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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