发明名称 CONTROL CIRCUIT FOR ELECTRONIC TEMPERATURE PROBE
摘要 <p>A control circuit for an electronic temperature probe includes a triangular wave generation circuit (20), a temperature signal processing circuit (30), a control signal output circuit (40), and a driving circuit for an electric heating tube (50). The triangular wave generation circuit (20) is used to generate triangular wave. The temperature signal processing circuit (30) includes a temperature regulating circuit for regulating the control temperature of the temperature probe, a temperature detecting circuit for detecting the temperature, and an operational amplifier (U1A) which is connected to the temperature regulating circuit and the temperature detecting circuit and compares to generate a temperature signal level. The control signal output circuit (40) is connected to the operational amplifiers (U1D,U1A) of the triangular wave generation circuit (20) and the temperature signal processing circuit (30) and is used to compare the triangular wave level with the temperature signal level to generate a control signal level. The driving circuit for an electric heating tube (50) is connected to the control signal output circuit (40) and is used to define a heating operation and heating time period.</p>
申请公布号 WO2010054592(A1) 申请公布日期 2010.05.20
申请号 WO2009CN74913 申请日期 2009.11.12
申请人 CHENG, JUNGHSING;TSANN KUEN (ZHANGZHOU) ENTERPRISE CO., LTD. 发明人 CHENG, JUNGHSING
分类号 G05D23/24 主分类号 G05D23/24
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