发明名称 METHOD FOR TESTING RELIABILITY OF SOLID-STATE STORAGE MEDIUM
摘要 A method for testing a reliability of a solid-state storage medium is provided, wherein the solid-state storage medium has a plurality of blocks. First, a lifetime of each of the blocks of the solid-state storage medium is obtained. Then, an erase count of each of the blocks is obtained, and whether the erase count is greater than a predetermined erase count is determined. After that, those blocks having their erase counts greater than the predetermined erase count are accumulated to generate a problematic block number, and a test report is output.
申请公布号 US2010125767(A1) 申请公布日期 2010.05.20
申请号 US20090372692 申请日期 2009.02.17
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 ZENG WEN-JUN
分类号 G11C29/04;G06F11/22 主分类号 G11C29/04
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