发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of manufacturing a highly reliable semiconductor device with high yield by bonding a bump more reliably. SOLUTION: A solder 24b is formed on a first substrate 11, and the solder 24b is irradiated with plasma PL in the atmospheric pressure. Following to irradiation with plasma PL, the first substrate 11 and a second substrate are bonded by the solder 24b. The plasma PL has a temperature beyond the melting point of the solder 24b. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010114149(A) 申请公布日期 2010.05.20
申请号 JP20080283450 申请日期 2008.11.04
申请人 RENESAS TECHNOLOGY CORP 发明人 KIMURA MICHITAKA;OKITA TAKANORI;IWASAKI TOSHIHIRO;HAYASHI EIJI
分类号 H01L21/60 主分类号 H01L21/60
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