发明名称 APPARATUS AND METHOD FOR TESTING ELECTRONIC APPARATUSES
摘要 A method for testing electronic apparatuses is provided. The method includes: reading an identification (ID) of an emulator adapter; searching for the script name in a test table according to the ID; fetching the script from a storage according to the determined script name and running the fetched script to pass each of input commands; and receiving and identifying each of the input commands to simulate a key input via an electrical conductive path, correspondingly to the input command, of the emulator adapter, such that an input key corresponding to the key input of the to-be-tested electronic apparatus is activated and the to-be-tested electronic apparatus performs a function associated with the input key correspondingly. A related test apparatus is also provided.
申请公布号 US2010125445(A1) 申请公布日期 2010.05.20
申请号 US20090350237 申请日期 2009.01.08
申请人 HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHENG HUA-DONG;ZHOU FENG;DUAN BIN-GANG;XU ZHI-XIN;YOU RUEY-SHYANG;WANG HAN-CHE
分类号 G06F9/455 主分类号 G06F9/455
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