发明名称 |
EXPOSURE METHOD, EXPOSURE APPARATUS, AND METHOD OF MANUFACTURING A DEVICE |
摘要 |
<p>PURPOSE: An exposure method, an exposure apparatus and a method for manufacturing a semiconductor device are provided to improve the quality of the semiconductor device by preventing the accumulation of process errors. CONSTITUTION: An exposure apparatus(10) exposures substrates(31) which are through a process apparatus. Mask patterns are transferred to the substrates. The process apparatus processes identical process with a plurality of processing units. An alignment unit arranges a plurality mark detectors on different positions. The mark detectors detect marks of the substrates.</p> |
申请公布号 |
KR20100053492(A) |
申请公布日期 |
2010.05.20 |
申请号 |
KR20100027810 |
申请日期 |
2010.03.29 |
申请人 |
NIKON CORPORATION |
发明人 |
IRIE NOBUYUKI |
分类号 |
H01L21/027;G03F7/20;G03F7/207;G03F9/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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