发明名称 EXPOSURE METHOD, EXPOSURE APPARATUS, AND METHOD OF MANUFACTURING A DEVICE
摘要 <p>PURPOSE: An exposure method, an exposure apparatus and a method for manufacturing a semiconductor device are provided to improve the quality of the semiconductor device by preventing the accumulation of process errors. CONSTITUTION: An exposure apparatus(10) exposures substrates(31) which are through a process apparatus. Mask patterns are transferred to the substrates. The process apparatus processes identical process with a plurality of processing units. An alignment unit arranges a plurality mark detectors on different positions. The mark detectors detect marks of the substrates.</p>
申请公布号 KR20100053492(A) 申请公布日期 2010.05.20
申请号 KR20100027810 申请日期 2010.03.29
申请人 NIKON CORPORATION 发明人 IRIE NOBUYUKI
分类号 H01L21/027;G03F7/20;G03F7/207;G03F9/00 主分类号 H01L21/027
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