发明名称 SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To adjust a gate interface by increasing a saturated charge amount Qs in a solid-state imaging device, and to suppress, for instance, the generation of a dark current or improve charge transfer by the adjustment of the gate interface. SOLUTION: The solid-state imaging device includes: a photodiode PD embedded in a semiconductor substrate 11 and acting as a photoelectric conversion element; a vertical transfer transistor Tr1 of which the channel direction is vertical to the semiconductor substrate 11; and an impurity ion implantation region 25 for gate interface adjusting formed around a transfer gate of the vertical transfer transistor Tr1. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010114274(A) 申请公布日期 2010.05.20
申请号 JP20080285908 申请日期 2008.11.06
申请人 SONY CORP 发明人 YAMADA AKITA;WATABE YASUICHIRO;KIDO HIDEO
分类号 H01L27/146;H04N5/335;H04N5/361;H04N5/369;H04N5/374;H04N101/00 主分类号 H01L27/146
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