发明名称 |
SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To adjust a gate interface by increasing a saturated charge amount Qs in a solid-state imaging device, and to suppress, for instance, the generation of a dark current or improve charge transfer by the adjustment of the gate interface. SOLUTION: The solid-state imaging device includes: a photodiode PD embedded in a semiconductor substrate 11 and acting as a photoelectric conversion element; a vertical transfer transistor Tr1 of which the channel direction is vertical to the semiconductor substrate 11; and an impurity ion implantation region 25 for gate interface adjusting formed around a transfer gate of the vertical transfer transistor Tr1. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010114274(A) |
申请公布日期 |
2010.05.20 |
申请号 |
JP20080285908 |
申请日期 |
2008.11.06 |
申请人 |
SONY CORP |
发明人 |
YAMADA AKITA;WATABE YASUICHIRO;KIDO HIDEO |
分类号 |
H01L27/146;H04N5/335;H04N5/361;H04N5/369;H04N5/374;H04N101/00 |
主分类号 |
H01L27/146 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|