发明名称 |
CAPACITANCE ADJUSTMENT CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD THEREFOR |
摘要 |
PURPOSE: A capacitance adjustment circuit for a semiconductor memory device and a method for manufacturing the same are provided to reduce the size of the semiconductor memory device by connecting or separating an input pad and a metal contact in order to adjust capacitance with respect to an input pin. CONSTITUTION: At least one capacitor(209) is formed on a semiconductor substrate(201). A contact hole(MnC) is formed to contact with the capacitor. An input pad(12) shields the contact hole. A conductive material fills the contact hole. The capacitor and the input pad is electrically connected or separated. A metal line is electrically connected to the contact hole.
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申请公布号 |
KR20100053046(A) |
申请公布日期 |
2010.05.20 |
申请号 |
KR20080112004 |
申请日期 |
2008.11.12 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, HYUN SEUNG |
分类号 |
H01L21/8242;G11C11/24;H01L21/28 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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