发明名称 CAPACITANCE ADJUSTMENT CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD THEREFOR
摘要 PURPOSE: A capacitance adjustment circuit for a semiconductor memory device and a method for manufacturing the same are provided to reduce the size of the semiconductor memory device by connecting or separating an input pad and a metal contact in order to adjust capacitance with respect to an input pin. CONSTITUTION: At least one capacitor(209) is formed on a semiconductor substrate(201). A contact hole(MnC) is formed to contact with the capacitor. An input pad(12) shields the contact hole. A conductive material fills the contact hole. The capacitor and the input pad is electrically connected or separated. A metal line is electrically connected to the contact hole.
申请公布号 KR20100053046(A) 申请公布日期 2010.05.20
申请号 KR20080112004 申请日期 2008.11.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, HYUN SEUNG
分类号 H01L21/8242;G11C11/24;H01L21/28 主分类号 H01L21/8242
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