发明名称 Method and apparatus for providing SEU-tolerant circuits
摘要 The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disruption or change of state on a single element by an SEU will not change the state flow of a circuit or lead to impermissible state changes. In one embodiment, the invention is implemented in quasi-delay-insensitive (QDI) asynchronous circuits.
申请公布号 US7721183(B2) 申请公布日期 2010.05.18
申请号 US20050216577 申请日期 2005.08.30
申请人 CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 MARTIN ALAIN J.;JANG WONJIN;NYSTROEM MIKA
分类号 H03M13/00 主分类号 H03M13/00
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