发明名称 |
Process and temperature insensitive flicker noise monitor circuit |
摘要 |
In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defects are within an allowable range.
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申请公布号 |
US7719299(B2) |
申请公布日期 |
2010.05.18 |
申请号 |
US20080061409 |
申请日期 |
2008.04.02 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HAROUN BAHER S.;CHANDRA GAURAV;RENTALA VIJAYA BHASKAR;SRINIVASAN VENKATESH;SHICHIJO HISASHI;NAGARAJ KRISHNASWAMY |
分类号 |
G01R31/02;H01L21/66 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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