发明名称 Apparatus and method for testing and debugging an integrated circuit
摘要 A system for receiving Joint Task Action Group (JTAG) data bits from a device under test includes a deserializer that receives serial messages from the device under test and forms data frames based on the serial messages. A frame sync module communicates with the deserializer and forms JTAG data bits based on the data frames. N virtual JTAG test access ports (VTAPs), each having an input and an output. The N VTAPs are connected in a daisy chain and the input of a first VTAP receives the JTAG data bits from the frame sync module.
申请公布号 US7721167(B1) 申请公布日期 2010.05.18
申请号 US20080154896 申请日期 2008.05.28
申请人 MARVELL INTERNATIONAL LTD. 发明人 AZIMI SAEED;HO SON;SMATHERS DANIEL
分类号 G01R31/28 主分类号 G01R31/28
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