发明名称 Integrated circuit ESD protection
摘要 A protective device in a semiconductor may comprise a substrate of a first conductivity type, an epitaxial layer formed on top of the substrate, a body area formed within the epitaxial layer of a second conductivity type extending from a top surface into the epitaxial layer, a first area of the first conductivity type extending from the top surface into the body area, an isolation area surrounding the first area, a ring area of the first conductivity type surrounding the isolation area, and a coupling structure for connecting the ring area with the substrate.
申请公布号 US7719025(B2) 申请公布日期 2010.05.18
申请号 US20060550650 申请日期 2006.10.18
申请人 INFINEON TECHNOLOGIES AG 发明人 CHEN QIANG;MA GORDON
分类号 H01L29/74 主分类号 H01L29/74
代理机构 代理人
主权项
地址