发明名称 Memory and semiconductor device with memory state detection
摘要 A memory includes: memory elements arranged in a matrix, each memory element having such characteristics that when an electric signal at a level equal to or higher than that of a first threshold signal is applied to the memory element, the resistance thereof is changed from a high value to a low value, and when an electric signal at a level equal to or higher than that of a second threshold signal is applied thereto, the resistance is changed from the low value to the high value, the polarities of the first and second threshold signals being different from each other; electric circuits for applying electric signals to the memory elements; and detection units each for measuring a current flowing through the corresponding memory element or a voltage applied thereto from the start of the application of electric signals to detect whether the resistance is high or low.
申请公布号 US7719873(B2) 申请公布日期 2010.05.18
申请号 US20050265894 申请日期 2005.11.03
申请人 SONY CORPORATION 发明人 HACHINO HIDENARI;MORI HIRONOBU;OKAZAKI NOBUMICHI;ARATANI KATSUHISA
分类号 G11C11/00 主分类号 G11C11/00
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