发明名称 COBALT DEPOSITION ON BARRIER SURFACES
摘要 Embodiments of the invention provide processes for depositing a cobalt layer on a barrier layer and subsequently depositing a conductive material, such as copper or a copper alloy, thereon. In one embodiment, a method for depositing materials on a substrate surface is provided which includes forming a barrier layer on a substrate, exposing the substrate to dicobalt hexacarbonyl butylacetylene (CCTBA) and hydrogen to form a cobalt layer on the barrier layer during a vapor deposition process (e.g., CVD or ALD), and depositing a conductive material over the cobalt layer. In some examples, the barrier layer and/or the cobalt layer may be exposed to a gas or a reagent during a treatment process, such as a thermal process, an in situ plasma process, or a remote plasma process.
申请公布号 WO2010025068(A3) 申请公布日期 2010.05.14
申请号 WO2009US54307 申请日期 2009.08.19
申请人 APPLIED MATERIALS, INC.;LU, JIANG;HA, HYOUNG-CHAN;MA, PAUL;GANGULI, SESHADRI;AUBUCHON, JOSEPH, F.;YU, SANG HO;NARASIMHAN, MURALI 发明人 LU, JIANG;HA, HYOUNG-CHAN;MA, PAUL;GANGULI, SESHADRI;AUBUCHON, JOSEPH, F.;YU, SANG HO;NARASIMHAN, MURALI
分类号 H01L21/28;H01L21/205 主分类号 H01L21/28
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