发明名称 FUSE BOX OF SEMICONDUCTOR DEVICE AND METHOD FOR REPAIR USING THE SAME
摘要 PURPOSE: A fuse box of a semiconductor device and a method for repair using the same are provided to prevent the repair fault causing a malfunction of a fuse by cutting a fuse with a laser. CONSTITUTION: An insulating layer(110) is formed in an upper part of a semiconductor substrate(100). The insulating layer comprises a plurality of trenches(T). A fuse(120) is formed within each trench. The fuse comprises a first fuse line(120a) and a second fuse line(120b). The first fuse line is arranged in one side of the trench. The second fuse line is arranged in the other side of the trench. The second fuse line is separated with the first fuse line. The first and the second fuse line are formed with aluminum or copper.
申请公布号 KR20100050980(A) 申请公布日期 2010.05.14
申请号 KR20080110126 申请日期 2008.11.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOO, MIN SOO
分类号 H01L21/82;H01L27/04;H01L27/10 主分类号 H01L21/82
代理机构 代理人
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