APPARATUS, SYSTEM, AND METHOD FOR PREDICTING FAILURES IN SOLID-STATE STORAGE

摘要

An apparatus, system, and method are disclosed for predicting failures in solid-state storage and include a determination module (302), a threshold module (304), a storage region error module (306), and a retirement module (308). The determination module (302) determines that data stored in an ECC chunk contains Error Correcting Code ("ECC") correctable errors and further determines a bit error count for the ECC chunk. The ECC chunk originates from non-volatile solid-state storage media (110). The threshold module (304) determines that the bit error count satisfies an ECC chunk error threshold. The storage region error module (306) determines that a storage region that contained contains at least a portion of the ECC chunk satisfies a region retirement criteria. The retirement module (310) retires the storage region that contains at least a portion of the ECC chunk where the storage region satisfies the region retirement criteria.