发明名称 PHASE CHANGE RAM DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A phase change ram device and a method of manufacturing the same are provided to improve a current driving performance by increasing the area of a diode. CONSTITUTION: A phase change memory device comprises a semiconductor substrate(100), an insulating layer(120), a diode(140), and a phase change memory cell. The insulating layer is arranged on the semiconductor substrate. The insulating layer comprises a contact hole(H). The critical dimension of end of a contact hole is larger than that of top and bottom. The diode is formed within the contact hole. The phase change memory cell is formed on the diode.</p>
申请公布号 KR20100050971(A) 申请公布日期 2010.05.14
申请号 KR20080110117 申请日期 2008.11.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, NAM KYUN
分类号 H01L27/115;H01L21/28;H01L21/8247 主分类号 H01L27/115
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