发明名称 DEFECT CORRECTION METHOD
摘要 PROBLEM TO BE SOLVED: To shorten the time for correcting defects in a wide area of a coating film, and to achieve the uniformity of the thickness of the coating film regardless of the unevenness of a substrate surface. SOLUTION: In a defect correction method for correcting a defect 6 of an orientation film 3 formed on a color filter substrate 1 surface, a chemical liquid dropping step of dropping a proper amount of a correcting liquid 5 to the defect 6, and a stamp pressing step of spreading out the correcting liquid 5 by pressing the color filter substrate 1 surface with a stamp 8 elastically deformed according to the unevenness of the color filter substrate 1 surface are carried out. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010104865(A) 申请公布日期 2010.05.13
申请号 JP20080276581 申请日期 2008.10.28
申请人 V TECHNOLOGY CO LTD 发明人 HIRANO TAKAFUMI;NAKABAYASHI AI
分类号 B05D1/26 主分类号 B05D1/26
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