| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an IC tester which determines number data in an order desired by a user. Ž<P>SOLUTION: A test system controller 10 of the IC tester 1 includes: an execution order data storage section 11c which, when a storage operation for storing number data in accordance with the order of number data successively transmitted during a test is received from the user, stores the number data in accordance with the order of transmission; a control section 25 which reads prestored set data successively in accordance with the order of the number data stored in the execution order data storage section 11c and analyzes the read set data successively; and a set value storage section 24b which stores set values obtained by the successive analyses by the control section 25 in correspondence with the number data. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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