发明名称 Semiconductor device and method of testing the same
摘要 A semiconductor device is formed on a semiconductor wafer. The semiconductor device has: an output buffer configured to externally output an output signal received from an internal circuit; an input buffer configured to output an input signal externally received to the internal circuit; a switch configured to control electrical connection between an output terminal of the output buffer and an input terminal of the input buffer; a first transmission path provided in a scribe region of the semiconductor wafer and connecting between the output terminal and the switch; and a second transmission path provided in the scribe region and connecting between the input terminal and the switch.
申请公布号 US2010117678(A1) 申请公布日期 2010.05.13
申请号 US20090589000 申请日期 2009.11.04
申请人 NEC ELECTRONICS CORPORATION 发明人 NAKABAYASHI MASAHIKO
分类号 G01R31/26;H01L23/58 主分类号 G01R31/26
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