发明名称 RESISTIVE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A resistive memory device includes a first conductive line on a substrate, a vertical selection diode comprising a nanowire or a nanotube and being arranged over the first conductive line, a resistive element including a resistive layer arranged over the vertical selection diode; and a second conductive line arranged over the resistive element.
申请公布号 US2010117041(A1) 申请公布日期 2010.05.13
申请号 US20080344443 申请日期 2008.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG YUN-TAEK;LEE YU-JIN
分类号 H01L47/00;H01L21/00 主分类号 H01L47/00
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