METHOD AND SYSTEM FOR SCATTER CORRECTION

摘要

A method and apparatus are provided for correcting primary and secondary emission data. The method includes obtaining an emission data set having primary and secondary emission data representative of primary and secondary emission particles emitting from a region of interest and applying a scatter correction model to the emission data set to derive an estimated scatter vector. The method also includes comparing the emission data set to the estimated scatter vector to identify an amount of secondary emission data in the emission data set and correcting the emission data set based on the amount of secondary emission data identified in the comparing operation.