发明名称 |
EXPOSURE APPARATUS, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR CONTROLLING EXPOSURE APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an exposure apparatus capable of excellently performing exposure processing, by suppressing the influence on devices/members around a substrate caused due to leakage of a liquid that forms an immersion region. <P>SOLUTION: The exposure apparatus exposes a substrate by projecting an image of a pattern on the substrate via a projection optical system and a liquid. The exposure apparatus has a liquid supply mechanism which supplies the liquid between the projection optical system and the substrate. The liquid feeding mechanism stops the supply of the liquid when abnormality is detected. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010109393(A) |
申请公布日期 |
2010.05.13 |
申请号 |
JP20100030696 |
申请日期 |
2010.02.15 |
申请人 |
NIKON CORP |
发明人 |
UMAGOME NOBUTAKA;KOBAYASHI NAOYUKI;SAKAKIBARA YASUYUKI;TAKAIWA HIROAKI |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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