发明名称 SPECIMEN PROCESSING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a specimen processing device capable of performing proper cleaning corresponding to the degree of adhesion of dirt, bubbles or the like. <P>SOLUTION: A specimen analyzer 1 includes first and second measuring units 2, 3 for measuring a specimen, and an information processing unit 5 for processing individually each measurement result by the first and second measuring units 2, 3 and acquiring each analysis result. The information processing unit 5 controls operation of the first measuring unit 2 and the second measuring unit 3 so as to change the number of times of cleaning operation in a start-up operation of the first measuring unit 2 and the second measuring unit 3 corresponding to an elapsed time from a previous shutdown completion time. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010107398(A) 申请公布日期 2010.05.13
申请号 JP20080280578 申请日期 2008.10.30
申请人 SYSMEX CORP 发明人 SHIBATA MASAHARU;FUKUMA DAIGO;NAGAI TAKAAKI
分类号 G01N35/10;G01N35/08 主分类号 G01N35/10
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