发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>PURPOSE: A semiconductor memory device and a method for manufacturing the same are provided to improve a driving property by obtain an one-time programmable(OTP) cell with a high cell-operation-current and a narrow distribution of a current value. CONSTITUTION: An OTP cell includes an OTP gate(140a) and a fuse electrode(140b). An electrically erasable programmable read only memory includes a memory transistor and a selection transistor. The memory transistor includes a first gate. The selection transistor includes a second gate. A first highly doped impurity region(132a), in which the OTP cell is overlapped with a fuse electrode, is formed on the lower side of the fuse electrode.</p>
申请公布号 KR20100049971(A) 申请公布日期 2010.05.13
申请号 KR20080109034 申请日期 2008.11.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, WEON HO
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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