发明名称 METHOD AND DEVICE FOR INSPECTING IMAGING MODULE
摘要 PROBLEM TO BE SOLVED: To simplify a hardware, and to shorten an inspection time simultaneously, by performing inspections by one-time imaging such as color inspection, focus inspection and black stain inspection, without replacing each inspection chart, concerning an inspection method of an imaging module and an inspection device of the imaging module. SOLUTION: The color inspection, the focus inspection and the black stain inspection of the imaging module are performed by using a multi-chart optical system wherein a chart for the focus inspection-cum-color inspection is arranged on a focal position of the imaging module integrated into a potable information apparatus, and a chart for the black stain inspection is arranged on a defocusing position separated far from a focusing position as a view from an imaging element. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010107425(A) 申请公布日期 2010.05.13
申请号 JP20080281136 申请日期 2008.10.31
申请人 FUJITSU LTD 发明人 FUSE TAKASHI;TSUKAHARA HIROYUKI;TAKAHASHI FUMIYUKI;NAGATO TAKESHI
分类号 G01M11/00;G01M11/02 主分类号 G01M11/00
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