| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical pickup device reliably testing electric conduction while preventing a connection failure between a testing device and the optical pickup device, and preventing damaging of the circuit of an important part such as a semiconductor laser part, an electronic device having the optical pickup device mounted thereon, and a device and a method for testing the optical pickup device. <P>SOLUTION: The optical pickup device includes an optical pickup body, and a flexible board 12 having a plurality of wiring parts 16 formed adjacent to each other to connect a connection terminal 14 with the optical pickup body. A wide wiring part 17 wider in the adjacent direction of the wiring part 16 than in the adjacent direction of the connection terminal 14 is formed in a part of each wiring part 16. Thus, by electrically connecting a plurality of connect pins 20 of the testing device with the wide wiring part 17, electric conduction is reliably tested while preventing a connection failure, and damage of an important part such as a semiconductor laser part is prevented. <P>COPYRIGHT: (C)2010,JPO&INPIT |
