发明名称 SPECIMEN ANALYZER AND SPECIMEN ANALYZING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an specimen analyzer capable of previously avoiding the wasteful preparation of a measuring sample by judging the necessity of re-detection corresponding to reliability and capable of precisely analyzing a component different in size, and a specimen analyzing method. <P>SOLUTION: The specimen analyzer is equipped with a sample preparing part for preparing the measuring sample containing a specimen and a reagent, a detection part for detecting the predetermined component in the measuring sample prepared in the sample preparing part and a detection controlling part for controlling the changeover of a detection condition used in a case that the predetermined component is detected. In a case that the detection result of the predetermined component in the measuring sample is judged to be unreliable, the operation of both of the sample preparing part and the detection part is controlled so as to prepare the measuring sample again on the basis of the same specimen, so that the detection condition used at the time of detection of the predetermined component in the again prepared measuring sample is changed over. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010107216(A) 申请公布日期 2010.05.13
申请号 JP20080276637 申请日期 2008.10.28
申请人 SYSMEX CORP 发明人 FUKUMA DAIGO;NAGAI TAKAAKI;SHIBATA MASAHARU
分类号 G01N35/08;G01N33/49;G01N35/00 主分类号 G01N35/08
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