| 摘要 |
PURPOSE: A semiconductor device and a power noise testing method thereof are provided to determine whether the malfunction is caused by the noise of the power or not by controlling the stability of a ground voltage and a power voltage when an inner circuit is trouble. CONSTITUTION: A semiconductor device comprises a power voltage supply terminal, a first controller(110), a ground voltage supply terminal, a second controller(120), and a circuit(130). The first controller controls the voltage stability of a power voltage. The second controller controls the voltage stability of the ground voltage. The circuit is operated by receiving the power voltage with the stability controlled by the first controller and the ground voltage with the stability controlled by the second controller.
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