发明名称 SPECIMEN ANALYZER, METHOD FOR CALIBRATING THE SAME AND COMPUTER PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a specimen analyzer capable of more reducing the cost required in the calibration of the specimen analyzer than before and capable of reducing the amount of the specimen used in the calibration, a method for calibrating the specimen analyzer and a computer program. <P>SOLUTION: The specimen analyzer 1 is equipped with first and second measuring units 2 and 3 for measuring the specimen and a data processing unit 4. The data processing unit 4 calibrates the first measuring unit 2 from the analytic result obtained when a calibrator is measured by the first measuring unit 2. Further, the data processing unit 4 further performs the calibration of the second measuring unit 3 using the analytic result obtained when the specimen for confirming reproducibility is measured by the first measuring unit 2 after calibration and the analytic result obtained when the specimen for confirming reproducibility is measured a plurality of times by the second measuring unit 3 to confirm the reproducibility of the analytic result. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010107255(A) 申请公布日期 2010.05.13
申请号 JP20080277437 申请日期 2008.10.28
申请人 SYSMEX CORP 发明人 FUKUMA DAIGO;SHIBATA MASAHARU
分类号 G01N35/00 主分类号 G01N35/00
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