发明名称 NON VOLATILE SEMICONDUCTOR STORAGE DEVICE AND ITS CONTROL METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor device which expands a setting range of a threshold voltage for a memory cell by practically increasing the threshold voltage of the memory cell for reading after programming; and to provide its control method. <P>SOLUTION: A NAND column has: n (n is an integer of≥3) memory cells MC which have charge storage layers FG and control gates CG, both mutually connected in series; a first selection gate transistor connected to a point between the one end of the n memory cells and a source line and a second selection gate transistor connected to a point between the other end of the n memory cells and a bit line. A control circuit applies a first voltage Vread_1 lower than a reading voltage Vread to be applied to the control gate of other non selected memory cells to the control gate CG (k-1) and CG (k+1) of the non selected memory cell adjacent to the selected memory cell in the NAND column when reading data. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010108548(A) 申请公布日期 2010.05.13
申请号 JP20080279665 申请日期 2008.10.30
申请人 TOSHIBA CORP 发明人 HOGYOKU MITSURU;SHIGYO NAOYUKI
分类号 G11C16/02;G11C16/04;G11C16/06 主分类号 G11C16/02
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