发明名称 |
NON VOLATILE SEMICONDUCTOR STORAGE DEVICE AND ITS CONTROL METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor device which expands a setting range of a threshold voltage for a memory cell by practically increasing the threshold voltage of the memory cell for reading after programming; and to provide its control method. <P>SOLUTION: A NAND column has: n (n is an integer of≥3) memory cells MC which have charge storage layers FG and control gates CG, both mutually connected in series; a first selection gate transistor connected to a point between the one end of the n memory cells and a source line and a second selection gate transistor connected to a point between the other end of the n memory cells and a bit line. A control circuit applies a first voltage Vread_1 lower than a reading voltage Vread to be applied to the control gate of other non selected memory cells to the control gate CG (k-1) and CG (k+1) of the non selected memory cell adjacent to the selected memory cell in the NAND column when reading data. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010108548(A) |
申请公布日期 |
2010.05.13 |
申请号 |
JP20080279665 |
申请日期 |
2008.10.30 |
申请人 |
TOSHIBA CORP |
发明人 |
HOGYOKU MITSURU;SHIGYO NAOYUKI |
分类号 |
G11C16/02;G11C16/04;G11C16/06 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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