发明名称 |
A METHOD AND APPRATUS FOR CASCADE SEMICONDUCTOR WAFER DRYING USING SURFACE TENSION GRADIENT |
摘要 |
PURPOSE: A method and an apparatus for drying a cascade semiconductor wafer are provided to remove particles from the surface of the semiconductor wafer using the surface tension gradient between deionized water and a protic polar solvent gas. CONSTITUTION: A semiconductor wafer(10) is arranged on a horizontal plane with a pre-set angle. A deionized water supply device(20) supplies deionized water from the upper side of the semiconductor wafer toward both side of the semiconductor wafer. A protic polar solvent gas is supplied to the both side of the semiconductor wafer. The deionized water on the both side of the semiconductor wafer is substituted to the protic polar solvent due to surface tension gradient between the deionized water and the protic polar solvent gas.
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申请公布号 |
KR20100049888(A) |
申请公布日期 |
2010.05.13 |
申请号 |
KR20080108916 |
申请日期 |
2008.11.04 |
申请人 |
MUJIN ELECTRONICS CO., LTD. |
发明人 |
GIMM, DAE HEE |
分类号 |
H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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